Application of TT-V40 Vacuum Benchtop XRF Spectrometer
It is Widely used for the analysis of Waelz Oxide (WOX), Waelz Kiln Clinker, smelting processes, pyrometallurgical processing, quality control, and process optimization applications.
Features of TT-V40 Vacuum Benchtop XRF Spectrometer
- Miniaturization, high performance, high speed, easy operation, high sensitivity, and high-precision analysis.
- Can analyze 40 elements simultaneously.
- Adopting multiple collimators, multiple filters, and patented background suppression technology.
- Peltier electrically cooled FAST SDD silicon drift detector provides excellent short-term repeatability and long-term reproducibility, as well as outstanding element peak resolution.
- Ultra-high counting digital multi-channel circuit design, dual vacuum pumping mechanism, and automatic vacuum degree stabilization system.
- Standard basic parameter method software with multitasking and multi-window operation.
- Patent thin-film filter technology effectively improves the detection limit of light elements.
- Vacuum optical path equipped with thin-film filter technology to improve the detection limit of light elements.
- Can analyze solids, liquids, powders, and slurries.
- Originally imported X-ray tube core provides reliable and excellent sample excitation performance.
- Non-destructive testing with rapid analysis results within 1-2 minutes.
- No need for chemical reagents and consumables.
Technical Specifications of TT-V40 Vacuum Benchtop XRF Spectrometer
| Model | TT-V40 |
| Instrument Dimensions | 565mm x 385mm x 415mm |
| Ultra Large Sample Cavity | 465mm x 330mm x 110mm |
| Semi Closed Sample Chamber (during vacuum pumping) | Ø150mm×75mm in height |
| Instrument Weight | 48 kg |
| Element Analysis Range | Na11-U92 Sodium to Uranuim |
| Analytical Content Range | 1ppm-99.99% |
| Detector | Ulta High Resolution Electric Refrigeration Fast SDD Silicon Drift Detector |
| Detector Resolution | 122 eV FWHM at 5.9 keV |
| Processor Type | Fully Digital DP-5 analyzer |
| Total Number of Spectral Channels | 4096 Channels |
| X-ray Tube | High-power 50W light tube |
| Cooling Method: Silicon Grease Cooling | |
| Light Tube Window Material | Beryllium Window |
| Collimator | 8 Options, minimum 0.2 mm |
| Filter | Free selections and switching of 7 types of filters |
| High Voltage Generator | Voltage Output: 0-50kV |
| Output Current: 0-1mA | |
| High Voltage Parameters | Minimum 5kV controllable adjustment |
| Built-in voltage overload protection | |
| Output Accuracy:0.01% | |
| Sample Observation System | 5-megapixel high-definition CCD camera |
| Voltage | 220ACV 50/60HZ |
| Environmental Temperature | -10 °C to 35 °C |
Waelz Oxide
| No. | Zn (%) | Pb (%) | As (%) | Cl (%) |
| 1 | 49.52 | 21.45 | 0.112 | 0.85 |
| 2 | 49.68 | 21.32 | 0.108 | 0.84 |
| 3 | 49.35 | 21.61 | 0.115 | 0.86 |
| 4 | 49.71 | 21.28 | 0.105 | 0.83 |
| 5 | 49.44 | 21.5 | 0.11 | 0.85 |
| 6 | 49.59 | 21.38 | 0.114 | 0.84 |
| 7 | 49.28 | 21.55 | 0.107 | 0.87 |
| 8 | 49.62 | 21.41 | 0.111 | 0.85 |
| 9 | 49.47 | 21.48 | 0.109 | 0.83 |
| 10 | 49.55 | 21.35 | 0.113 | 0.86 |
| Average | 49.521 | 21.433 | 0.11 | 0.848 |
| SD | 0.141 | 0.107 | 0.0031 | 0.0132 |
| RSD (%) | 0.29% | 0.50% | 2.81% | 1.55% |
Waelz Oxide
| No. | Zn (%) | Pb (%) | As (%) | Fe(%) | CaO (%) | SiO2 (%) | AI203 (%) | Cu (%) |
| 1 | 0.22 | 0.25 | 0.065 | 31.25 | 21.15 | 24.85 | 5.12 | 1.34 |
| 2 | 0.21 | 0.24 | 0.061 | 31.42 | 21.08 | 24.92 | 5.15 | 1.35 |
| 3 | 0.23 | 0.26 | 0.068 | 31.11 | 21.24 | 24.71 | 5.08 | 1.32 |
| 4 | 0.22 | 0.23 | 0.059 | 31.35 | 21.02 | 24.98 | 5.18 | 1.36 |
| 5 | 0.21 | 0.25 | 0.064 | 31.2 | 21.19 | 24.8 | 5.11 | 1.33 |
| 6 | 0.22 | 0.24 | 0.066 | 31.28 | 21.11 | 24.87 | 5.14 | 1.35 |
| 7 | 0.24 | 0.26 | 0.062 | 31.05 | 21.28 | 24.65 | 5.05 | 1.31 |
| 8 | 0.22 | 0.23 | 0.065 | 31.39 | 21.05 | 24.91 | 5.13 | 1.34 |
| 9 | 0.21 | 0.25 | 0.06 | 31.18 | 21.22 | 24.78 | 5.09 | 1.33 |
| 10 | 0.23 | 0.24 | 0.063 | 31.31 | 21.14 | 24.84 | 5.16 | 1.36 |
| Average | 0.221 | 0.245 | 0.063 | 31.254 | 21.151 | 24.831 | 5.121 | 1.339 |
| SD | 0.0099 | 0.0118 | 0.0028 | 0.117 | 0.081 | 0.1 | 0.04 | 0.0173 |
| RSD (%) | 4.40% | 4.81% | 4.49% | 0.37% | 0.38% | 0.40% | 0.78% | 1.29% |
Standard Configuration of TT-V40 Vacuum Benchtop XRF Spectrometer
| Model | Qty |
| Main Unit | 1 set |
| Pure Ag Initialization Standard | 1 pc |
| Vacuum Pump | 1 pc |
| Special Sample Cup for Ore | 1 pc |
| SB Data Cable | 1 pc |
| Power Cord | 1 pc |
| Test Film | 1 pc |
| Operational Manual | 1 pc |
| Warranty Card | 1 pc |
