TT-5565HAST High Pressure Accelerated Aging Test Chamber

TESTRON TT-5565HAST is suitable for IC packaging, semiconductors, microelectronic chips, magnetic materials and other electronic parts for high pressure, high temperature, unsaturated/saturated damp heat, and other accelerated life reliability tests. It is used in the product design stage to quickly expose product defects and weaknesses and to test the tightness and aging performance of the products.

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