TT-3545 HAST Highly Accelerated Aging Test Chamber

The Accelerated Aging Test Chamber is a high and low-pressure damp heat test chamber suitable for IC packaging, semiconductors, microelectronic chips, magnetic materials, and other electronic parts for high-pressure, high-temperature, unsaturated/saturated damp heat, and other accelerated life reliability tests. It is used in the product design stage. To quickly expose product defects and weaknesses. Test the tightness and aging performance of its products.

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