TT-3545 HAST Highly Accelerated Life Aging Test Chamber

The TT-3545 HAST High Pressure Accelerated Aging Test Chamber high and low pressure damp heat test chamber is suitable for IC packaging, semiconductors, microelectronic chips, magnetic materials and other electronic parts for high pressure, high temperature, unsaturated/saturated damp heat, and other accelerated life reliability tests. It is used in the product design stage. To quickly expose product defects and weaknesses. Test the tightness and aging performance of its products.

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